hi aaron,
aaron_do wrote on Apr 30th, 2010, 8:27am:Hi subgold,
I'm only talking about 65 nm technology. i.e. when comparing two transistors in the same technology, one where I set the gate length at 60 nm and the other where I set the gate length at 200 nm (for example). The longer transistor has a reduced VTH. Is this result normal?
i dont see any abnormality with the longer transistor having a reduced vth. as i said, that is actually what i have seen from all the technologies i have used.
i would expect in a short channel transistor, since the gate dimension is smaller, the interface cap is also smaller, so u need a higher voltgate to obatin suffienct charges under the gate to compensate the carriers in the substrate, so as to create the depletion layer.
but i have to say i am no physics guru, do you have some physics proof to show that this shouldn't be the case?
Quote: I'm not comparing VTH of different technologies, but it does seem quite strange that the VTH would be so high. It is actually even higher than the VTH of the 0.18 um PDK I am also using (for the 60 nm in 65 nm node versus the 180 nm in 180 nm node anyway).
cheers,
Aaron
isnt this what i said in my previous post? they increase the gate oxide thickness when they go from 180nm process to 65nm, maybe for the sake of leakage prevention and so on.
in general i dont think the vth is very high. it is really the case that the vsupply/vth ratio drops drastically when the technology geometry gets slimmer, and the headroom thus becomes one of the biggest obstacles in the design, for example i think u can hardly find a cascode amp in these technologies. (the other critical issue would be the low gm*gds value so you need more gain stages). please notice these technologies are optimized only for digital circuits and they are actually very unfriendly to analog design.